MIL-O-52374 Oscillator: High Voltage General Specification ForThis specification covers the general requirements for a transistorized, high-voltage, oscillator.

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MIL-O-52374E

TABLE VI.  Group "C" special sampling.

4.3.4.3.1  Sampling for inspection.  Three (3) sample units shall be selected at random for inspections in table VI, except for MTBF, from every 100 produced or every 30 days, whichever occurs first.  A minimum of ten (10) units shall be tested for MTBF (see 4.4.12) selected from oscillators which have met the requirements of group A, table IV.  The first samples selected shall be at the start of the contract

from the first conformance inspection production lot (see 4.3.4.3).

4.3.4.3.2  Noncompliance.  The contractor shall immediately report in writing each group C failure occurrence, including details of the failure and characteristics affected.  The contractor shall immediately investigate the cause of failure and report the results of the investigation.  As soon as practicable the contractor shall report on details of the proposed corrective action on (a) the processes and materials, as applicable, and (b) all oscillators which were manufactured under the same conditions, and which may be considered subject to the same failure.  Reports shall be made to the responsible technical activity designated in the contract or purchase order through the Government Quality Assurance Representative. After corrective action has been taken an additional sample equal in size to the first sample shall be subjected to the special sampling inspection (all inspections or the inspection which the sample failed, at the option of the Government).  Final acceptance and shipment will be withheld until the special sampling reinspection results have shown that the corrective action is effective.

4.3.5  Reinspection of conforming group C sample unit.  Unless otherwise specified, sample units which have been subjected to and passed Group C inspection may be accepted on the contract or order provided all damage is repaired and the sample units are resubjected to and pass group A inspection.

4.4  Inspection procedures.

4.4.1  Test conditions.  Tests shall be conducted in accordance with the test procedures specified herein.  Unless otherwise specified in the test procedures test conditions shall be as follows:

a.  The oscillator shall be connected to the test circuit as shown in figure 4.  Note that a 6914 Image

Converter Tube conforming to MIL-PRF-1/1049 shall be used.

b.  Input voltage to the oscillator shall be 6.00 and 6.75 ±0.025 V dc. c.  Output voltage is the voltage measured across C1 in figure 4.

d.  Total capacitance of the load (Multiplier, the Jennings Probe and stray wire) shall be 15 pF

maximum.

e. No load.

f.  Environmental chambers used for tests shall maintain the specified temperature within ±2°C and the relative humidity within ±5 percent.

g.  S1  (see figure 4) closed.

h.  All tests shall be conducted at room temperature.

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