MIL-PRF-49166/3A(CR)
3.5.1.4 Scan angle. The scan angle shall be 12.8, ±0.5 degrees.
3.5.2 Interlace. The MX-9872(V)3/UA shall operate in the 2:1 interlace mode. The
interlace switching time shown in MIL-PRF-49166, Figure 1, shall not be greater than 3.6
milliseconds (ms).
3.5.3 Scan direction. The MX-9872(V)3/UA shall show the waveform shapes and phase
relationships in Figure 1 while operating in the 2:1 rear interlace mode.
3.5.4 Power consumption. Power required to operate the MX-9872(V)3/UA shall not
exceed 7.5 watts.
3.5.5 Scan efficiency. The MX-9872(V)3/UA scan efficiency shall be a minimum of 65
percent.
3.5.6 Scan jitter in azimuth. Jitter time shall be 18.0 microseconds maximum.
3.6 Environmental conditions. See MIL-PRF-49166 except as follows:
3.6.1 Vibration. The MX-9872(V)3/UA shall not be damaged by vibration over a frequency
spectrum at the specified g levels and amplitudes shown in Figure 2 for the X axis and as shown in
Figure 3 of MIL-PRF-49166 for the Y and Z axes. During specified vibration, the average interlace
waveform amplitude shown in MIL-PRF-49166, Figure 1 shall not deviate from the amplitude
without vibration by more than ±50 percent.
3.7 Workmanship. All electronic parts, components, assemblies or sub-assemblies shall be
free of smudges, excess solder, metal chips or the existence of any foreign material on any surface.
Bearing assemblies shall be free from rust, dirt or tool marks. Wires and integrated circuitry shall be
protected from contact with rough or irregular surfaces and be shielded from shorting. MIL-HDBK-
454 may be used as guidance.
4. VERIFICATION
4.1 Classification of inspections. The inspection requirements specified herein are classified
as follows:
a. First article inspection (see 4.2)
b. Conformance inspection (see 4.3)
4.2 First article inspection. First article inspection shall be performed on a specified number
of scanners when a first article sample is required (see 3.1). This inspection shall include the
examination of 4.4 and the tests of 4.5.1.2 and 4.5.3 included herein; and the test of MIL-PRF-
49166 herein referred to in paragraphs 4.5.1.4, 4.5.2, 4.5.4, 4.5.5, 4.5.6, and 4.6 referenced herein.
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