MIL-PRF-49177B(CR)
TABLE III. Group A inspection.
Inspection
Requirement
Test
On Scan-Interlace
paragraph
paragraph
Adjustment during
Pins tested
test
Power consumption
3.5.1
4.5.1
None
None
Identification resistor
3.5.2
4.5.2
None
J1-1, J1-2, J1-3
verification
±2.4 Vdc Regulator
3.5.3
4.5.3
None
J1-18, J2-2
voltage
Start-up electronics
3.5.4
4.5.4
None
J1-17
Scan transducer
3.5.5
4.5.5
None
J2-7, P1-15
amplifiers
Sync drive
3.5.6
4.5.6
Sync delay R106,
P1-30, P1-22
Sync width R115
Spring limit pulse
3.5.7
4.5.7
Spring limit level
J2-15
width
R18
Scan rate
3.5.8
4.5.8
Scan rate R8
J2-13
Scan drive
3.5.9
4.5.9
Scan drive bal. R32
J2-6
Scan rate R8
Scan motor drive
3.5.10
4.5.10
None
J2-6, P1-13
amplifier
Interlace transducer
3.5.11
4.5.11
None
P1-3, J1-9
amplifier
Interlace position
3.5.12
4.5.12
Interlace pos. ref.
J1-8
reference
R93
Interlace rate
3.5.13
4.5.13
Interlace rate ref.
J1-13
reference
R114
Interlace position
3.5.14
4.5.14
Pos. error gain R111
J1-14
error
Solenoid drive
3.5.15
4.5.15
Solenoid drive
J1-14, J1-5, J1-7
amplifiers
balance R124
Video gate
3.5.16
4.5.16
Gate width adjust
P1-21
R160
J2-15
Transducer bridge
3.5.17
4.5.17
Bridge voltage
P1-12
voltage
R122
Scan fail electronics
3.5.18
4.5.18
None
P1-13, J1-5
4.4.2.2 Group B inspection. Not required.
4.4.2.3 Group C inspection. Group C inspections shall be conducted on Scan-interlace
assemblies selected from units which have passed the tests in 4.4.2.1. The Sample (s) shall be
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