MIL-PRF-49166C(CR)
4.3.2.3.2 Group C failures. Actions required relative to Group C failures shall be as
specified in the contract (see 6.2).
4.3.2.3.3 Disposition of Group C samples. Group C samples shall be accepted on contract
subsequent to the tests of Table III.
4.3.2.4 Group D inspection. Not required.
4.4 Sampling. Sampling for Group A and C shall be in accordance with the contract or
purchase order.
4.5 Methods of inspection. Unless otherwise specified, the tests shall be performed
utilizing the Scan-interlace module as specified in the applicable specification sheet.
4.5.1 Scan angle and frequency.
4.5.1.1 Variable scan frequency. The scanner shall be connected to Scan-Interlace, PL-
1408/UA and mounted on a suitable fixture. Power shall be applied to the scanner and the output
of the azimuth transducer (Scan-Interlace) shall be monitored with a calibrated frequency counter.
The output of the scan drive electronics shall be varied to demonstrate that the requirements of
3.6.1.1 are met. Failure to meet the requirements of 3.6.1.1 shall constitute failure of this test.
4.5.1.2 Specific scan frequency. See applicable specification sheet.
4.5.1.3 Synchronous scan frequency. See applicable specification sheet.
4.5.1.4 Scan angle. The angle shall be determined as follows:
4.5.1.4.1 Test apparatus. The test apparatus shall consist of a holding fixture, a projection
system capable of projecting a spot or marker into the scanner along the x-axis (Figure 4) and an
appropriate scale graduated in degrees measured about the scan mirror axis with its zero position
located on the y-axis (Figure 4).
4.5.1.4.2 Test conduction. The scanner shall be operated and the angular excursions of the
projected spot in each direction shall be recorded. One-half of the sum of the excursions shall be
the measured scan angle.
4.5.1.4.3 Failure criteria. Failure to meet the requirements of 3.6.1.4 shall constitute failure
of this test.
4.5.2 Interlace. With the scanner operating in a suitable fixture, the output of the interlace
position transducer shall be monitored with an oscilloscope. The waveform switching times
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