MIL-PRF-49166C(CR)
(Figure 1) shall be measured to verify the requirement of 3.6.2 is met. Failure to meet
requirements of 3.6.2 shall constitute failure of this test.
4.5.3 Scan direction. With the scanner operating, the outputs of the azimuth and interlace
position transducers or the interlace transducer and scan tachometer (using the appropriate scan-
interlace module) shall be observed with an oscilloscope. The output waveforms shall show the
shape and phase relationships as specified in the applicable specification sheets. Failure to meet
the requirements of 3.6.3 shall constitute failure of this test.
4.5.4 Power consumption. The scan drive electronics shall be connected to constant
voltage power supplies. The current being drawn by the electronics from each voltage source
shall be measured to obtain the average current being drawn. The power delivered to the module
shall be calculated as the sum of the products of the power supply voltages and their average
currents. Failure to meet requirements of 3.6.4 shall constitute failure of this test.
4.5.5 Scan efficiency. With the scanner operating, the period of the azimuth position
transducer waveform shall be measured with an oscilloscope. The scanner shall then be stopped,
and the scan mirror moved from contact with one return spring to contact with the opposite
return spring. Simultaneously, the signal level of the transducer at the spring contact points shall
be noted on the oscilloscope. With the scanner operating, the period of time that the transducer
output is between the two signal levels during one cycle shall be determined from the oscilloscope
display. The ratio of this period of time to the azimuth position transducer waveform period
which was measured previously is the duty cycle or scan efficiency of the scanner operated with
the appropriate scan-interlace module. See applicable specification sheet (see 3.1) when a scan-
interlace module other than PL-1408/UA is used. Failure to meet the requirements of 3.6.5 shall
constitute failure of this test.
4.5.6 Scan jitter in azimuth. The scanner shall be set up and operating as in 4.5.1.2. The
scan jitter may be measured by use of an oscilloscope or similar method that will provide
conclusive evidence that the scanner meets its requirements. Using an oscilloscope, the scan
position zero crossing detection circuit shall be measured for jitter on any positive transition edge
(see Figure 2). Failure to meet requirements of 3.6.6 shall constitute failure of this test.
4.5.7 Scan jitter in interlace. The output of the interlace position transducer shall be
monitored with an oscilloscope. The average interlace movement signal, defined as the average of
the difference between the waveform amplitude on the forward scan and the waveform amplitude
on the reverse scan at identical scan mirror azimuth positions, shall be measured. Scan jitter in
interlace is defined as the variation of the above differences from the average interlace movement
signal. Failure to meet requirements of 3.6.7 shall constitute failure of this test.
4.5.8 Modulation transfer function (MTF). The scanner shall be located in a 38.0, ±0.5
mm collimated bundle of visible radiation (660 nanometers peak, with 20 nanometer half-power
bandwidth) parallel and centered on the optical axis. The scanner shall be tested on the MTF
apparatus that yields sine wave response. The image area to be analyzed shall be at least ±1.5
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