MIL-PRF-49169B(CR)
4.6.1 Temperature shock. The LED module shall be tested in accordance with MIL-STD-810,
Method 503, Procedure I except that the temperature of steps 1 and 4 shall be +95°C and the
temperature of step 2 shall be -54°C. The LED module shall not be operated during the
temperature shock test ( no measurement taken during this test). Failure to meet requirements of
3.7.1 shall constitute failure of this test.
4.6.2. High temperature. The LED module shall be tested in accordance with MIL-STD-810,
Method 501, Procedure I except that the temperature of step 2 shall be +95°C and the LED
module shall be operated during the final 30 minutes of step 3 at 4 Vdc bias (no measurements
taken during step 3). The temperature of step 4 and 5 shall be +71°C. The unit shall be operated
at +71°C. Failure to meet the requirements of 3.7.2 shall constitute failure of this test.
4.6.3. Low temperature. The LED module shall be tested in accordance with MIL-STD-810,
Method 502, Procedure I except that the storage temperature of step 2 shall be -62°C and shall be
maintained until temperature stabilization is reached. The low operating temperatures of steps 4
and 5 shall be -54°C. Failure to meet the requirements of 3.7.3 shall constitute failure of this test.
4.6.4. Shock. The LED module shall be tested in accordance with MIL-STD-810, Method
516.1, Procedure IV, Figure 516.1-1 (100 g's peak value at 11 milliseconds duration) and
Procedure V. The LED shall not be operated during the shock test. Failure to meet the
requirements of 3.7.4 shall constitute failure of this test.
4.6.5. Vibration. The LED module shall be tested in accordance with MIL-STD-810, Method
514.1, Procedures I and VIII except that the curve shown in Figure 1 of this specification shall be
used in lieu of the MIL-STD-810 curves. The LED module shall not be operated during
vibration. The sinusoidal cycling time shall be 120 minutes per axis. The dwell time shall be one-
sixth of the cycling time at each resonance. Failure to meet the requirements of 3.7.5 shall
constitute failure of this test.
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