MIL-PRF-49316A(CR)
TABLE V. Pattern resolutions.
Pattern No.
High light
Low light
0.47 CY/MR, ± 7 percent.
0.19 CR/MR, ± 7 percent
1
0.53 CY/MR, ± 7 percent
0.21 CY/MR, ± 7 percent
2
0.59 CY/MR, ± 7 percent
0.23 CY/MR, ± 7 percent
3
0.67 CY/MR, ± 7 percent
0.26 CY/MR, ± 7 percent
4
0.75 CY/MR, ± 7 percent
0.30 CY/MR, ± 7 percent
5
0.84 CY/MR, ± 7 percent
0.33 CY/MR, ± 7 percent
6
NOTE: The two projected patterns shall be within 7 degrees of the center of the field of
view. No light sources other than the test target shall be visible when the Test Set is in this
mode.
3.5.12 Radiometric light output. With the Test Set passing the self test feature the
average light level in the focal plane of a
27 ± 1mm EFL, T-1.58, maximum clear aperture of 23mm test objective lens mounted to the
Test Set output port shall be as listed in Table VI. The reading shall apply over a 6mm diameter
circle centered in the test objective focal plane. Table VI is based on 820 ± 25 nanometers
radiation specified in 3.5.6. All values are watts/cm2.
TABLE VI. Average light levels for test objective lens
mounted to the Test Set output port.
AN/PVS-5/AN/PVS-7
AN/AVS-6(ANVIS)
Selector
7.89 x 10-9 ± 50 percent
2.14 x 10-9 ± 50 percent
High Light
3.09 x 10-11 ± 30 percent
8.37 x 10-12 ± 20 percent
Low Light
3.5.13 Collimation. The two patterns projected by the Test Set shall be collimated within
3 minutes or less as measured by the center circle of the test patterns. When combined with
collimation attachment, the total collimation error shall be 9 minutes or less in the horizontal
direction and 6 minutes or less in the vertical direction. The edges of the rectangles on the two
patterns shall be aligned rotationally with each other within 2 degrees or less.
3.5.13.1 Collimation test pattern. The Test Set shall present a pattern to the binocular
that consists of a high density black rectangle of 2 degrees ± 10 minutes width and 1 degree ± 10
minutes height (see Figure 2). Centered in the rectangle shall be a 6 minute ± 1 minute clear
circle.
3.5.13.2 Focus. In both the high light level or low light level test mode, the test pattern
shall be focused at infinity +0.0/-0.020 diopters for 820 nanometer illumination.
3.5.14 Vignetting. The Test Set shall present a full 40 degree minimum field of view test
target to the ANVIS or NVG under test.
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