MIL-PRF-49167B(CR)
The waveform voltage limits shall be adjustable by potentiometers on the auxiliary control
module. Failure to meet requirements of 3.5.2 shall constitute failure of this test.
4.4.3 IR gain command voltages. Gain command voltages 1 and 2 shall be monitored
with an oscilloscope while the gain control input is varied through its limits. Failure to meet
requirements of 3.5.3 shall constitute failure of this test.
4.4.4 Regulator output voltages. Regulator output voltages shall be determined using the
conditions described in 4.6.1. The low power mode will require adjusting the positive and
negative outputs from +3 Vdc to +3.5 Vdc and from -3.0 Vdc to -3.5 Vdc. The high power
mode will require adjusting the positive and negative outputs from +3.0 Vdc to +4.5 Vdc and
from -3.0 Vdc to -4.5 Vdc. Failure to meet requirements of 3.5.4 shall constitute failure of this
test.
4.4.5 IR polarity control outputs. The IR polarity control outputs shall be measured with
a voltmeter when the polarity control is switched from the inverting position to the noninverting
position. Failure to meet requirements of 3.5.5 shall constitute failure of this test.
4.4.6 Polarity transient suppression. The polarity transient suppression feature shall be
tested by monitoring the IR level and gate output on channel A and the polarity input on channel
B of the dual-channel oscilloscope with storage capability. As the polarity input is switched, the
duration of the gated portion of the IR level and gate waveform shall be measured and verified.
Failure to meet requirements of 3.5.6 shall constitute failure of this test.
4.4.7 Scan failure protect. The scan failure protect feature shall be tested by monitoring
the IR level and gate output on channel A and the IR gate input on channel B of the dual-channel
oscilloscope. A square wave generator shall be used to provide the IR gate input, and its
frequency shall be decreased to approximately 4 Hz to determine the threshold at which the IR
level waveform begins to return to its gated state. The duration from IR gate input transition to
the threshold of IR level and gate output shall be measured and verified. Failure to meet
requirements of 3.5.7 shall constitute failure of this test.
4.5 Environmental tests. The operating tests required before, during and after the
environmental tests shall be those listed in table III. MIL-STD-810 may be used as a guide.
4.5.1 Temperature shock. With MIL-STD-810, Method 503, Procedure I, used as guide,
except that the temperature of step 2 shall be -54°C and the temperature of step 1 and step 4 shall
be +95°C. The auxiliary control module shall not be operated during the temperature shock test
(no measurements taken during this test). Failure to meet requirements of 3.6.1 shall constitute
failure of this test.
4.5.2 High temperature. With MIL-STD-810, Method 501, Procedure I, used as guide,
except that the temperature of step 2 shall be +95°C and the auxiliary control module shall be
operated using the test setup of 4.6.1 for the final 30 minutes of step 3 (no measurements taken
during step 3). The temperature of steps 4 and 5 shall be +71°C. The operating test of 4.4.4 shall
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